Acta Metallurgica Sinica (English Letters) ›› 2015, Vol. 28 ›› Issue (6): 758-765.DOI: 10.1007/s40195-015-0258-0
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G. Vimal1, Kamal P. Mani1, P. R. Biju1, Cyriac Joseph1(), N. V. Unnikrishnan1, M. A. Ittyachen1
Received:
2014-10-02
Revised:
2014-12-14
Online:
2015-03-24
Published:
2015-07-23
G. Vimal, Kamal P. Mani, P. R. Biju, Cyriac Joseph, N. V. Unnikrishnan, M. A. Ittyachen. Influences of Annealing Temperature and Doping Concentration on Microstructural and Optical Properties of CeO2:Sm3+ Nanocrystals[J]. Acta Metallurgica Sinica (English Letters), 2015, 28(6): 758-765.
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Annealing temperature (°C) | Sm3+ concentration (mol%) | 2θ (°) | a (Å) | Crystal volume (Å3) | Strain (10-4) | Size from HW plot (nm) | Size from Scherrer equation (nm) |
---|---|---|---|---|---|---|---|
600 | 0 | 28.65 | 5.405 | 157.95 | 0.818 | 25 | 25 |
0.5 | 28.65 | 5.405 | 157.95 | 1.01 | 24 | 23 | |
1 | 28.648 | 5.405 | 157.95 | 1.54 | 22 | 22 | |
1.5 | 28.638 | 5.405 | 157.95 | 2.25 | 25 | 24 | |
2 | 28.58 | 5.409 | 158.23 | 2.34 | 23 | 22 | |
5 | 28.60 | 5.413 | 158.63 | 2.91 | 23 | 21 | |
10 | 28.55 | 5.418 | 159.02 | 5.01 | 20 | 19 | |
20 | 28.45 | 5.427 | 159.92 | 5.46 | 18 | 16 | |
800 | 0 | 28.75 | 5.40 | 157.57 | 0.285 | 70 | 63 |
0.5 | 28.70 | 5.402 | 157.63 | 0.34 | 67 | 61 | |
1 | 28.68 | 5.402 | 157.63 | 0.495 | 69 | 63 | |
1.5 | 28.68 | 5.403 | 157.76 | 1.25 | 77 | 67 | |
2 | 28.67 | 5.404 | 157.85 | 1.57 | 72 | 59 | |
5 | 28.65 | 5.411 | 158.46 | 1.76 | 69 | 56 | |
10 | 28.60 | 5.419 | 159.14 | 2.39 | 46 | 37 | |
20 | 28.53 | 5.429 | 160.02 | 2.62 | 46 | 36 |
Table 1 Crystalline size, lattice parameter, crystal volume and microstrain of pure and Sm3+-doped CeO2 annealed at 600 and 800 °C
Annealing temperature (°C) | Sm3+ concentration (mol%) | 2θ (°) | a (Å) | Crystal volume (Å3) | Strain (10-4) | Size from HW plot (nm) | Size from Scherrer equation (nm) |
---|---|---|---|---|---|---|---|
600 | 0 | 28.65 | 5.405 | 157.95 | 0.818 | 25 | 25 |
0.5 | 28.65 | 5.405 | 157.95 | 1.01 | 24 | 23 | |
1 | 28.648 | 5.405 | 157.95 | 1.54 | 22 | 22 | |
1.5 | 28.638 | 5.405 | 157.95 | 2.25 | 25 | 24 | |
2 | 28.58 | 5.409 | 158.23 | 2.34 | 23 | 22 | |
5 | 28.60 | 5.413 | 158.63 | 2.91 | 23 | 21 | |
10 | 28.55 | 5.418 | 159.02 | 5.01 | 20 | 19 | |
20 | 28.45 | 5.427 | 159.92 | 5.46 | 18 | 16 | |
800 | 0 | 28.75 | 5.40 | 157.57 | 0.285 | 70 | 63 |
0.5 | 28.70 | 5.402 | 157.63 | 0.34 | 67 | 61 | |
1 | 28.68 | 5.402 | 157.63 | 0.495 | 69 | 63 | |
1.5 | 28.68 | 5.403 | 157.76 | 1.25 | 77 | 67 | |
2 | 28.67 | 5.404 | 157.85 | 1.57 | 72 | 59 | |
5 | 28.65 | 5.411 | 158.46 | 1.76 | 69 | 56 | |
10 | 28.60 | 5.419 | 159.14 | 2.39 | 46 | 37 | |
20 | 28.53 | 5.429 | 160.02 | 2.62 | 46 | 36 |
Fig. 3 XRD peak corresponds to the (111) plane CeO2 for different doping concentrations of Sm3+ and splitting of the peak of Sm3+ doping concentration of 20 mol% (inset)
Annealing Temperature (°C) | Sm3+ (%) | X-ray density (g/cm3) | Specific surface area (m2/gm) | Bulk density (g/cm3) | Porosity |
---|---|---|---|---|---|
600 | 0 | 7.24 | 33.2 | 5.77 | 0.20 |
0.5 | 7.24 | 36 | 5.64 | 0.22 | |
1 | 7.24 | 37.7 | 5.20 | 0.28 | |
1.5 | 7.24 | 34.5 | 5.15 | 0.29 | |
2 | 7.23 | 37.7 | 5.10 | 0.30 | |
5 | 7.21 | 39.6 | 5.04 | 0.30 | |
10 | 7.20 | 43.9 | 4.89 | 0.32 | |
20 | 7.16 | 52.3 | 4.57 | 0.36 | |
800 | 0 | 7.25 | 11.8 | 6.28 | 0.13 |
0.5 | 7.25 | 12.3 | 6.2 | 0.14 | |
1 | 7.25 | 12 | 6.30 | 0.13 | |
1.5 | 7.25 | 10.8 | 6.25 | 0.14 | |
2 | 7.22 | 11.5 | 6.22 | 0.14 | |
5 | 7.22 | 12 | 6.2 | 0.14 | |
10 | 7.19 | 18.1 | 6.18 | 0.14 | |
20 | 7.15 | 18.2 | 5.6 | 0.22 |
Table 2 X-ray density, specific surface area, bulk density and porosity of pure and Sm3+-doped CeO2 annealed at 600 and 800 °C
Annealing Temperature (°C) | Sm3+ (%) | X-ray density (g/cm3) | Specific surface area (m2/gm) | Bulk density (g/cm3) | Porosity |
---|---|---|---|---|---|
600 | 0 | 7.24 | 33.2 | 5.77 | 0.20 |
0.5 | 7.24 | 36 | 5.64 | 0.22 | |
1 | 7.24 | 37.7 | 5.20 | 0.28 | |
1.5 | 7.24 | 34.5 | 5.15 | 0.29 | |
2 | 7.23 | 37.7 | 5.10 | 0.30 | |
5 | 7.21 | 39.6 | 5.04 | 0.30 | |
10 | 7.20 | 43.9 | 4.89 | 0.32 | |
20 | 7.16 | 52.3 | 4.57 | 0.36 | |
800 | 0 | 7.25 | 11.8 | 6.28 | 0.13 |
0.5 | 7.25 | 12.3 | 6.2 | 0.14 | |
1 | 7.25 | 12 | 6.30 | 0.13 | |
1.5 | 7.25 | 10.8 | 6.25 | 0.14 | |
2 | 7.22 | 11.5 | 6.22 | 0.14 | |
5 | 7.22 | 12 | 6.2 | 0.14 | |
10 | 7.19 | 18.1 | 6.18 | 0.14 | |
20 | 7.15 | 18.2 | 5.6 | 0.22 |
Fig. 4 SEM images of the crystals: a CeO2 annealed at 400 °C; b CeO2 doped with 1 mol% Sm3+ annealed at 400 °C; c CeO2 annealed at 600 °C; d CeO2 doped with 1 mol% Sm3+ annealed at 600 °C; e CeO2 annealed at 800°C; f CeO2 doped with 1 mol% Sm3+ annealed at 800 °C
Fig. 5 TEM images of the crystals: a pure CeO2 annealed at 400 °C; b CeO2 doped with 1 mol% Sm3+ annealed at 400 °C; c HRTEM and SAED pattern of pure CeO2 annealed at 400 °C; d pure CeO2 annealed at 600 °C
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