Acta Metallurgica Sinica (English Letters) ›› 1991, Vol. 4 ›› Issue (9): 211-218.

• Research paper • Previous Articles     Next Articles

MICROSTRUCTURE OF SILICON CARBIDE WHISKERS

XU Haigang ZHU Jing YUAN Hong Central Iron and Steel Research Institute,Ministry of Metallurgical Industry,Beijing,ChinaNING Xiaoguang YE Hengqiang Laboratory of Atomic Imaging of Solids,Institute of Metal Research,Academia Sinica,Shenyang,China   

  • Received:1991-09-11 Revised:1991-09-11 Online:1991-09-11 Published:2009-10-10

Abstract: The morphology,crystal defects and chemical compositions of surfaces in two kinds of SiC whiskers related to their growth mechanism have been studied by means of electron microscopy and surface chemical analyses.Based upon the experimental results,five criteria for evaluating the whisker microstructure were suggested as:proportion of the perfect single crystals,morphology and dimensions,defects and their distribution,the bulk and surface chemistries,and crystallographic characteristics.

Key words: SiC, whisker, microstructure, defect