Sub-solvus Cellular Recrystallization and P Phase Formation in a Single-Crystal Superalloy Containing Re

doi:10.1007/s40195-014-0169-5

Abstract

Abstract:

Sub-solvus recrystallization behavior of a second-generation single-crystal superalloy has been studied by transmission electron microcopy and scanning transmission electron microcopy. Surface local stress facilitated cellular recrystallization accompanied with formation of twin structure and TCP phase of P during annealing at sub-solvus temperature of 1,100°C. The precipitation of P phase is considered to be attributed to the coarsening of γ′ phase in the recrystallized aggregates which lower the activation energy for atomic migration.

Key words: Nickel-based single-crystal superalloys, Interfaces, Recrystallization, Twin boundary, STEM

Long-Chao Zhuo, Ming Huang, Ji-Chun Xiong, Jia-Rong Li, Jing Zhu. Sub-solvus Cellular Recrystallization and P Phase Formation in a Single-Crystal Superalloy Containing Re[J]. Acta Metallurgica Sinica (English Letters), 2015, 28(1): 72-76.

Figures/Tables 3

Fig. 1 Bright field TEM images of typical CR aggregate a, twin formation with the SAED pattern inserted b, taken from the specimen annealed at 1,100 °C for 4 h

Fig. 2 Bright field TEM images of further developed CR aggregates a-c, P phases with one SAED pattern inserted d, for the specimen annealed at 1,100 °C for 16 h

Fig. 3 HAADF image a of P phase, γ and γ′ in one CR aggregate of the Ni-based single-crystal superalloy, and corresponding mapping images of the elements Ni, Ta, Co, Al, W, Cr, Re, and Mo b-i

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