Effect of Mineralization Induced by Shewanella algae on Passive Film of Stainless Steel via FIB-SEM/TEM and EELS

doi:10.1007/s40195-025-01816-2

Abstract

Abstract:

The adhesion of Shewanella algae (S. algae) on the surface of stainless steel induced the formation and coverage of calcium carbonate minerals in the aerobic environment, and the effect of these minerals on the passive film of stainless steel was investigated by focused ion beam-scanning electron microscopy/transmission electron microscopy (FIB-SEM/TEM) and electron energy loss spectroscopy (EELS) techniques. The TEM and energy-dispersive X-ray spectroscopy (EDS) results revealed that the passive film in the region covered by mineralized particles underwent chelation between Fe and Cr compounds with CaCO₃, forming an unstable amorphous layer, which accelerated the loss of Fe and Cr elements. EELS analysis showed that the loss of Fe element in the passive film was the most significant, with a transition from Fe³⁺ to soluble Fe²⁺ occurring, which caused by the iron-reducing property and metabolic activities of the adherent S. algae. The loss of the main metal elements caused the accelerated degradation of the passive film beneath the minerals.

Key words: Microbiologically influenced corrosion, Shewanella algae, Stainless steel, Microbial mineralization

Li Zhao, Tian-Yu Cui, Wei-Wei Chang, Hong-Chang Qian, Yun-Tian Lou, Jing-Zhi Yang, Da-Wei Zhang. Effect of Mineralization Induced by Shewanella algae on Passive Film of Stainless Steel via FIB-SEM/TEM and EELS[J]. Acta Metallurgica Sinica (English Letters), 2025, 38(6): 877-888.

Figures/Tables 9

Table 1 Chemical compositions of the 201 stainless steel samples (wt%)

C	Cr	Mn	Si	Ni	S	P	Fe
0.12	17.2	6.20	0.80	4.80	0.01	0.03	Bal.

Fig. 1 SEM morphologies of the sample surface after immersion for a 1 day, b 3 days, and c 7 days; d EDS maps of the sample after 3 days of immersion

Fig. 2 XRD spectra of the original sample and samples immersed in S. algae-inoculated media

Fig. 3 Sectioning process of slices between mineralized particle/metal interface by FIB-SEM/TEM: a selection of mineralization products, b platinum protection and milling, c lifting a slice for SEM/TEM characterization, d cross-sectional SEM tomography of the slice, e TEM observation of the upper-left (yellow dashed box) region of d

Fig. 4 TEM bright-field image a, b, HRTEM image at the interface between mineralized particle/metal in slices c, regular lattice images of the upper-left (yellow dashed box) region d and lower-right (blue dashed box) region e

Fig. 5 HAADF-EDS maps on side of 201 stainless steel substrate

Fig. 6 HAADF-EDS maps on side of mineralized particle

Fig. 7 Electronic image and EELS mapping of passive film a without the coverage of mineralized particle, b with the coverage of mineralized particle

Fig. 8 EELS mapping in different areas of passive film

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