Acta Metallurgica Sinica (English Letters) ›› 2022, Vol. 35 ›› Issue (4): 693-702.DOI: 10.1007/s40195-021-01285-3
W. B. Shi1,2, Y. M. Liu3, W. H. Li1,2, T. Li1,2, H. Lei1, J. Gong1, C. Sun1()
Received:
2021-03-18
Revised:
2021-05-31
Accepted:
2021-06-11
Online:
2021-08-09
Published:
2021-08-09
Contact:
C. Sun
About author:
C. Sun, csun@imr.ac.cnW. B. Shi, Y. M. Liu, W. H. Li, T. Li, H. Lei, J. Gong, C. Sun. Microstructure and Properties of WB2/Cr Multilayer Films with Different Bilayer Numbers Deposited by Magnetron Sputtering[J]. Acta Metallurgica Sinica (English Letters), 2022, 35(4): 693-702.
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Target | Current | Sputtering time (s) | ||||
---|---|---|---|---|---|---|
(A) | M5 | M10 | M20 | M30 | M40 | |
WB2 | 0.5 | 788 | 394 | 197 | 131 | 99 |
Cr | 0.2 | 490 | 245 | 123 | 82 | 62 |
Table 1 Deposition parameters of the WB2/Cr multilayer films with different bilayer numbers
Target | Current | Sputtering time (s) | ||||
---|---|---|---|---|---|---|
(A) | M5 | M10 | M20 | M30 | M40 | |
WB2 | 0.5 | 788 | 394 | 197 | 131 | 99 |
Cr | 0.2 | 490 | 245 | 123 | 82 | 62 |
Sample designation | Parameters |
---|---|
Target material | Cr (99.99%); WB2 (99.9%) |
Substrate temperature (°C) | 450 |
Distance between target and substrate (mm) | 70 |
Working pressure (Pa) | 0.7 |
Substrate bias voltage (V) | - 100 |
Target current (A) | Cr (0.2 A); WB2 (0.5 A) |
Bilayer number | 5, 10, 20, 30, 40 |
Table 2 Processing parameters of WB2/Cr multilayer films in this experiment
Sample designation | Parameters |
---|---|
Target material | Cr (99.99%); WB2 (99.9%) |
Substrate temperature (°C) | 450 |
Distance between target and substrate (mm) | 70 |
Working pressure (Pa) | 0.7 |
Substrate bias voltage (V) | - 100 |
Target current (A) | Cr (0.2 A); WB2 (0.5 A) |
Bilayer number | 5, 10, 20, 30, 40 |
No | Bilayer number | Λ (nm) | RMS (Å) | H (GPa) | E (GPa) | Lc2 (N) | W (× 10-7 mm3/Nm) |
---|---|---|---|---|---|---|---|
M5 | 5 | 318 | 64.4 | 25.5 ± 0.9 | 453.6 ± 14.5 | 26 | 5.3 |
M10 | 10 | 153 | 39.6 | 27.1 ± 0.8 | 424.9 ± 16.6 | 37 | 2.06 |
M20 | 20 | 85 | 45.5 | 31.3 ± 0.7 | 489.2 ± 17.2 | 41 | 3.31 |
M30 | 30 | 55 | 35.3 | 33.9 ± 1.4 | 542.6 ± 29.1 | 67 | 1.78 |
M40 | 40 | 42 | 23 | 26.8 ± 0.8 | 483 ± 13.6 | 30 | 7.46 |
Table 3 Average values of modulation period (Λ), RMS roughness, H, E, Lc2 and W of the films with different bilayer numbers
No | Bilayer number | Λ (nm) | RMS (Å) | H (GPa) | E (GPa) | Lc2 (N) | W (× 10-7 mm3/Nm) |
---|---|---|---|---|---|---|---|
M5 | 5 | 318 | 64.4 | 25.5 ± 0.9 | 453.6 ± 14.5 | 26 | 5.3 |
M10 | 10 | 153 | 39.6 | 27.1 ± 0.8 | 424.9 ± 16.6 | 37 | 2.06 |
M20 | 20 | 85 | 45.5 | 31.3 ± 0.7 | 489.2 ± 17.2 | 41 | 3.31 |
M30 | 30 | 55 | 35.3 | 33.9 ± 1.4 | 542.6 ± 29.1 | 67 | 1.78 |
M40 | 40 | 42 | 23 | 26.8 ± 0.8 | 483 ± 13.6 | 30 | 7.46 |
Fig. 5 a Typical TEM micrograph of the WB2/Cr multilayer film for M30; b corresponding HRTEM image on the black rectangular area (the inset is the FFT pattern of the area); c TEM micrograph of the WB2/Cr multilayer film for M40; d corresponding HRTEM image on the black rectangular area
Fig. 7 Typical friction-load curve of the M30 multilayer film with bilayer number of 30. a Optical images of scratch tracks; b, c local region of the scratch track in high magnification; d acoustic emission signals and friction curves as a function of load
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