An Algorithm to Analyze Electron Backscatter Diffraction Data for Grain Reconstruction: from Methodology to Application

doi:10.1007/s40195-016-0413-2

Abstract

Abstract:

An algorithm for grain reconstruction based on electron backscatter diffraction data was proposed in this paper. This algorithm can well record the original data arrangement when an external file for the reconstructed grain(s) was exported for further post-processing. Assisted by an in-house MATLAB program, grain reconstruction, lattice rotations, orientation spreads, and slip system analysis can be performed. The validity of this algorithm has been successfully tested by polycrystalline Ni before and after channel die compression.

Key words: Grain reconstruction, Algorithm, Electron backscatter diffraction, Deformation, Nickle

Xue-Hao Zheng, Hong-Wang Zhang. An Algorithm to Analyze Electron Backscatter Diffraction Data for Grain Reconstruction: from Methodology to Application[J]. Acta Metallurgica Sinica (English Letters), 2016, 29(5): 491-499.

Figures/Tables 12

Table 1 Data for grain 1 in Fig. 1a exported by our in-house program

Index	Phase	Xpos(μm)	Ypos(μm)	Euler 2(º)	Grain Id^a
1	0	0	0	0	2
2	0	5	0	0	2
3	1	10	0	45	1
4	1	15	0	45	1
5	0	20	0	0	3
6	0	0	5	0	2
7	0	5	5	0	2
8	1	10	5	45	1
9	1	15	5	45	1
10	0	20	5	0	3
11	0	0	10	0	5
12	1	5	10	45	1
13	1	10	10	45	1
14	1	15	10	45	1
15	0	20	10	0	3
16	0	0	15	0	5
17	0	5	15	0	5
18	0	10	15	0	4
19	0	15	15	0	4
20	0	20	15	0	4

Fig. 1 Schematic illustration of the grain reconstruction performed by Oxford HKL a and the corresponding scanned grid where six grains are indicated b. The pixels of grain 1 are highlighted and marked as a symbol “√” and the remaining pixels are marked as a symbol “×”

Table 2 Data for grain 1 in Fig. 1a exported by HKL

Index	Phase	Xpos(μm)	Ypos(μm)	Euler 2(º)	Grain Id^a
1	1	10	0	45	1
2	1	15	0	45	1
3	1	10	5	45	1
4	1	15	5	45	1
5	1	5	10	45	1
6	1	10	10	45	1
7	1	15	10	45	1

Fig. 2 Schematic illustrations of the grain maps before a after b the grain reassignment

Fig. 3 Schematic illustrations of the channel die compression and split-sample technique. The sample coordinate system is indicated

Fig. 4 Influence of the distribution of misorientation angles by the lower cutoff angle

Fig. 5 Reconstructed grain map of the sample before a, c and after deformation b, d by the present algorithm a, b and HKL Channel 5 software c, d, respectively. The black lines represent boundaries with misorientation angles larger than 5°. Grains in a, b are colored according to their average orientations (Euler contrast) while pixels in c, d are colored according to ND

Fig. 6 Rotation axis map a and rotation angle map c for the 136 reconstructed grains. The color scheme used in a is shown in b. Stereographic projections of rotation axes for six typical grains (marked by “A”-“D”) are shown in d. The black lines in a and c represent boundaries with misorientation angles larger than 5°

Fig. 7 a Stereographic projection showing the <110>, <111> and <112> directions in the crystal coordinate system. Contour maps with Miller indices corresponding to the maximum intensities highlight the distributions of rotation axes for grain “B” b and grain “F” c

Fig. 8 Rotation axis maps and the corresponding intensity contour maps of the whole grain a, d, grain boundary region b, e, and the rest of grain “B” c, f, respectively

Fig. 9 Misorientation axis map a and misorientation angle map b for grains with areas larger than 20 μm2. Each color in a represents a specific misorientation axis between a pixel and the average orientation of the selected grain where the pixel is located. The color scheme used in a can be found in Fig. 6b. The black lines in a and b represent boundaries with misorientation angles larger than 5°

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