Acta Metallurgica Sinica (English Letters) ›› 2015, Vol. 28 ›› Issue (5): 567-578.DOI: 10.1007/s40195-015-0233-9
• Orginal Article • Previous Articles Next Articles
Received:
2014-07-31
Revised:
2014-10-28
Online:
2015-02-15
Published:
2015-07-23
Rangasami Chinnusamy. Non-equilibrium Phases Formed in Cu-In-Se-Te System Synthesized by Melt-Quench Method[J]. Acta Metallurgica Sinica (English Letters), 2015, 28(5): 567-578.
Add to citation manager EndNote|Ris|BibTeX
Fig. 3 a XRD pattern and the results of Rietveld refinement for CuIn(Se0.1Te0.9), the crosses and the overlying solid line represent the experimental data and the calculated profile, respectively, and the short vertical markers indicate possible Bragg reflections, whereas the bottom curve denotes the difference between the experimental and calculated data, b inset shows the enlarged view of 112 reflection, c inset shows the spectrum in the 2θ range of 80°-130°, on an expanded scale
hkl | d cal (Å) | I cal (%) |
---|---|---|
101 | 5.5095 | 1.1 |
112 | 3.5575 | 100.0 |
103 | 3.4207 | 4.3 |
211 | 2.6874 | 6.0 |
204 | 2.1793 | 47.6 |
220 | 2.1768 | 23.0 |
301 | 2.0245 | 2.3 |
116 | 1.8599 | 15.2 |
312 | 1.8568 | 28.2 |
323 | 1.5772 | 2.4 |
008 | 1.5428 | 3.9 |
400 | 1.5393 | 6.2 |
316 | 1.4141 | 9.6 |
332 | 1.4127 | 4.4 |
325 | 1.4044 | 1.6 |
228 | 1.2587 | 5.9 |
424 | 1.2573 | 10.5 |
512 | 1.1850 | 4.3 |
408 | 1.0424 | 3.1 |
Table 1 Calculated lattice spacing (d cal), relative intensity (I cal) and Miller indices of selected reflections of CuIn(Se0.1Te0.9)2
hkl | d cal (Å) | I cal (%) |
---|---|---|
101 | 5.5095 | 1.1 |
112 | 3.5575 | 100.0 |
103 | 3.4207 | 4.3 |
211 | 2.6874 | 6.0 |
204 | 2.1793 | 47.6 |
220 | 2.1768 | 23.0 |
301 | 2.0245 | 2.3 |
116 | 1.8599 | 15.2 |
312 | 1.8568 | 28.2 |
323 | 1.5772 | 2.4 |
008 | 1.5428 | 3.9 |
400 | 1.5393 | 6.2 |
316 | 1.4141 | 9.6 |
332 | 1.4127 | 4.4 |
325 | 1.4044 | 1.6 |
228 | 1.2587 | 5.9 |
424 | 1.2573 | 10.5 |
512 | 1.1850 | 4.3 |
408 | 1.0424 | 3.1 |
Fig. 4 a XRD pattern and the results of Rietveld refinement for CuIn(Se0.5Te0.5)2, the crosses and the overlying solid line represent the experimental data and the calculated profile, respectively, and the short vertical markers indicate possible Bragg reflections, whereas the bottom curve denotes the difference between the experimental and calculated data, b inset shows the enlarged view of 112 reflection, c inset shows the spectrum in the 2θ range of 80°-130°, on an expanded scale
hkl | CuIn(Se0.35Te0.65)2 | CuIn(Se0.55Te0.45)2 | CuIn(Se0.62Te0.38)2 | |||
---|---|---|---|---|---|---|
d cal (Å) | I cal (%) | d cal (Å) | I cal (%) | d cal (Å) | I cal (%) | |
101 | 5.4186 | 0.6 | 5.3477 | 3.1 | 5.3078 | 1.1 |
112 | 3.4997 | 90.7 | 3.4537 | 100.0 | 3.4273 | 68.6 |
103 | 3.3675 | 3.9 | 3.3229 | 4.1 | 3.2956 | 3.3 |
211 | 2.6423 | 6.5 | 2.6079 | 6.0 | 2.5890 | 4.9 |
204 | 2.1446 | 21.7 | 2.1163 | 47.0 | 2.0996 | 32.3 |
220 | 2.1401 | 20.3 | 2.1122 | 22.9 | 2.0971 | 15.5 |
301 | 1.9905 | 3.4 | 1.9645 | 2.3 | 1.9504 | 1.5 |
116 | 1.8314 | 14.2 | 1.8071 | 14.4 | 1.7919 | 9.9 |
312 | 1.8258 | 24.2 | 1.8019 | 27.8 | 1.7888 | 18.0 |
323 | 1.5510 | 3.0 | 1.5307 | 2.5 | 1.5194 | 1.8 |
008 | 1.5197 | 3.5 | 1.4994 | 3.4 | 1.4864 | 2.3 |
400 | 1.5133 | 5.3 | 1.4936 | 6.4 | 1.4829 | 4.0 |
316 | 1.3915 | 9.3 | 1.3731 | 9.7 | 1.3623 | 6.7 |
332 | 1.3890 | 3.9 | 1.3709 | 4.7 | 1.3610 | 3.0 |
325 | 1.3815 | 1.6 | 1.3633 | 1.8 | 1.3530 | 1.2 |
228 | 1.2391 | 5.9 | 1.2227 | 6.2 | 1.2127 | 3.9 |
424 | 1.2364 | 9.3 | 1.2203 | 11.7 | 1.2112 | 6.8 |
512 | 1.1651 | 3.3 | 1.1499 | 4.8 | 1.1416 | 2.9 |
512 | 1.1651 | 3.3 | 1.1499 | 4.8 | 1.1416 | 2.9 |
Table 2 Calculated lattice spacing (d cal), relative intensity (I cal) and Miller indices of selected reflections of CuIn(Se0.35Te0.65)2, CuIn(Se0.55Te0.45)2 and CuIn(Se0.62Te0.38)2
hkl | CuIn(Se0.35Te0.65)2 | CuIn(Se0.55Te0.45)2 | CuIn(Se0.62Te0.38)2 | |||
---|---|---|---|---|---|---|
d cal (Å) | I cal (%) | d cal (Å) | I cal (%) | d cal (Å) | I cal (%) | |
101 | 5.4186 | 0.6 | 5.3477 | 3.1 | 5.3078 | 1.1 |
112 | 3.4997 | 90.7 | 3.4537 | 100.0 | 3.4273 | 68.6 |
103 | 3.3675 | 3.9 | 3.3229 | 4.1 | 3.2956 | 3.3 |
211 | 2.6423 | 6.5 | 2.6079 | 6.0 | 2.5890 | 4.9 |
204 | 2.1446 | 21.7 | 2.1163 | 47.0 | 2.0996 | 32.3 |
220 | 2.1401 | 20.3 | 2.1122 | 22.9 | 2.0971 | 15.5 |
301 | 1.9905 | 3.4 | 1.9645 | 2.3 | 1.9504 | 1.5 |
116 | 1.8314 | 14.2 | 1.8071 | 14.4 | 1.7919 | 9.9 |
312 | 1.8258 | 24.2 | 1.8019 | 27.8 | 1.7888 | 18.0 |
323 | 1.5510 | 3.0 | 1.5307 | 2.5 | 1.5194 | 1.8 |
008 | 1.5197 | 3.5 | 1.4994 | 3.4 | 1.4864 | 2.3 |
400 | 1.5133 | 5.3 | 1.4936 | 6.4 | 1.4829 | 4.0 |
316 | 1.3915 | 9.3 | 1.3731 | 9.7 | 1.3623 | 6.7 |
332 | 1.3890 | 3.9 | 1.3709 | 4.7 | 1.3610 | 3.0 |
325 | 1.3815 | 1.6 | 1.3633 | 1.8 | 1.3530 | 1.2 |
228 | 1.2391 | 5.9 | 1.2227 | 6.2 | 1.2127 | 3.9 |
424 | 1.2364 | 9.3 | 1.2203 | 11.7 | 1.2112 | 6.8 |
512 | 1.1651 | 3.3 | 1.1499 | 4.8 | 1.1416 | 2.9 |
512 | 1.1651 | 3.3 | 1.1499 | 4.8 | 1.1416 | 2.9 |
Initial Se content (x) | Number of phases | Se content (x) in individual phase | Phase fraction (%) | a (Å) | c (Å) | Tetragonal distortion (c/2a) | R wp (%) | GOF |
---|---|---|---|---|---|---|---|---|
0.1 | 1 | 0.10 | 100 | 6.15703(26) | 12.34222(65) | 0.99772 | 5.19 | 2.983 |
0.2 | 2 | 0.18 | 67 | 6.12237(73) | 12.27821(190) | 0.99727 | 7.82 | 1.003 |
0.25 | 33 | 6.09521(71) | 12.21471(209) | 0.99801 | ||||
0.4 | 2 | 0.33 | 52 | 6.06921(44) | 12.18564(150) | 0.99612 | 4.83 | 1.483 |
0.49 | 48 | 5.99396(34) | 12.02776(146) | 0.99577 | ||||
0.5 | 3 | 0.35 | 34 | 6.05305 (58) | 12.15750 (186) | 1.00366 | 3.89 | 1.070 |
0.55 | 39 | 5.97425(77) | 11.99530 (256) | 0.99669 | ||||
0.62 | 27 | 5.93152 (30) | 11.89101 (136) | 0.99610 | ||||
0.6 | 3 | 0.40 | 39 | 6.03299(224) | 12.02198(977) | 0.99765 | 6.92 | 1.003 |
0.68 | 26 | 5.91551(104) | 11.89604(406) | 0.99453 | ||||
0.74 | 35 | 5.88897(25) | 11.83534(108) | 0.99515 | ||||
0.8 | 2 | 0.77 | 62 | 5.88152 (53) | 11.88444 (180) | 0.98978 | 4.19 | 1.573 |
0.83 | 38 | 5.83357 (15) | 11.72506 (65) | 0.99506 | ||||
0.9 | 2 | 0.87 | 67 | 5.83236(37) | 11.74639(122) | 0.99305 | 5.37 | 1.340 |
0.95 | 33 | 5.80642(9) | 11.66750(40) | 0.99532 |
Table 3 Selenium content, phase fraction, lattice parameters and discrepancy factors of CuIn(SexTe1-x)2 system
Initial Se content (x) | Number of phases | Se content (x) in individual phase | Phase fraction (%) | a (Å) | c (Å) | Tetragonal distortion (c/2a) | R wp (%) | GOF |
---|---|---|---|---|---|---|---|---|
0.1 | 1 | 0.10 | 100 | 6.15703(26) | 12.34222(65) | 0.99772 | 5.19 | 2.983 |
0.2 | 2 | 0.18 | 67 | 6.12237(73) | 12.27821(190) | 0.99727 | 7.82 | 1.003 |
0.25 | 33 | 6.09521(71) | 12.21471(209) | 0.99801 | ||||
0.4 | 2 | 0.33 | 52 | 6.06921(44) | 12.18564(150) | 0.99612 | 4.83 | 1.483 |
0.49 | 48 | 5.99396(34) | 12.02776(146) | 0.99577 | ||||
0.5 | 3 | 0.35 | 34 | 6.05305 (58) | 12.15750 (186) | 1.00366 | 3.89 | 1.070 |
0.55 | 39 | 5.97425(77) | 11.99530 (256) | 0.99669 | ||||
0.62 | 27 | 5.93152 (30) | 11.89101 (136) | 0.99610 | ||||
0.6 | 3 | 0.40 | 39 | 6.03299(224) | 12.02198(977) | 0.99765 | 6.92 | 1.003 |
0.68 | 26 | 5.91551(104) | 11.89604(406) | 0.99453 | ||||
0.74 | 35 | 5.88897(25) | 11.83534(108) | 0.99515 | ||||
0.8 | 2 | 0.77 | 62 | 5.88152 (53) | 11.88444 (180) | 0.98978 | 4.19 | 1.573 |
0.83 | 38 | 5.83357 (15) | 11.72506 (65) | 0.99506 | ||||
0.9 | 2 | 0.87 | 67 | 5.83236(37) | 11.74639(122) | 0.99305 | 5.37 | 1.340 |
0.95 | 33 | 5.80642(9) | 11.66750(40) | 0.99532 |
Se content (x) | Anion displacement (μm) | Bond length (Å) | Bond angle (°) | |||||
---|---|---|---|---|---|---|---|---|
d (Cu-Se/Te) | d (In-Se/Te) | Cu-Se/Te-Cu | In-Se/Te-In | Se/Te-Cu-Se/Te | Se/Te-In-Se/Te | Cu-Se/Te-In | ||
0.10 | 0.22393(30) | 2.5788(10) | 2.7638(11) | 115.36(7) | 104.09(6) | 106.511(33) | 108.155(16) | 109.104(7) |
110.971(17) | 112.136(32) | 109.289(16) | ||||||
0.18 | 0.2237(4) | 2.5638(14) | 2.7497(16) | 115.44(9) | 104.05(8) | 106.46(5) | 108.152(22) | 109.075(13) |
110.999(24) | 112.14(4) | 109.296(9) | ||||||
0.25 | 0.2238(4) | 2.5521(14) | 2.7365(16) | 115.39(9) | 104.05(8) | 106.51(5) | 108.139(22) | 109.117(14) |
110.973(24) | 112.17(4) | 109.277(10) | ||||||
0.33 | 0.21436(29) | 2.5130(9) | 2.7618(11) | 117.64(7) | 102.24(6) | 105.378(32) | 107.709(15) | 108.807(11) |
111.556(17) | 113.057(31) | 109.121(8) | ||||||
0.35 | 0.21188(25) | 2.4989(8) | 2.7642(10) | 118.24(6) | 101.76(5) | 105.088(29) | 107.593(13) | 108.723(14) |
111.706(15) | 113.298(27) | 109.065(8) | ||||||
0.40 | 0.2217(4) | 2.5143(17) | 2.7115(19) | 115.73(10) | 103.48(9) | 106.59(7) | 107.887(32) | 109.084(26) |
110.930(35) | 112.69(7) | 109.38(5) | ||||||
0.49 | 0.22873(29) | 2.5270(9) | 2.6739(11) | 114.28(7) | 105.10(6) | 106.979(32) | 108.431(15) | 109.130(8) |
110.731(16) | 111.573(31) | 109.398(16) | ||||||
0.55 | 0.23241(25) | 2.5312(9) | 2.6523(9) | 113.46(6) | 105.87(5) | 107.348(30) | 108.638(14) | 109.149(14) |
110.543(15) | 111.150(29) | 109.466(7) | ||||||
0.62 | 0.21928(25) | 2.4698(8) | 2.6797(9) | 116.44(6) | 103.17(5) | 106.000(28) | 107.919(13) | 109.196(6) |
111.234(14) | 112.623(27) | 109.006(9) | ||||||
0.68 | 0.2257(4) | 2.4863(14) | 2.6515(16) | 115.03(10) | 104.55(9) | 106.53(5) | 108.332(24) | 108.965(22) |
110.960(26) | 111.77(5) | 109.408(13) | ||||||
0.74 | 0.2337(4) | 2.5002(14) | 2.6105(15) | 113.19(10) | 106.17(9) | 107.44(5) | 108.734(23) | 109.114(7) |
110.495(24) | 110.96(5) | 109.508(6) | ||||||
0.77 | 0.21566(27) | 2.4449(8) | 2.6769(10) | 117.50(6) | 102.67(5) | 105.167(31) | 107.937(14) | 109.327(8) |
111.665(16) | 112.585(30) | 108.497(12) | ||||||
0.83 | 0.23797(27) | 2.4904(9) | 2.5713(9) | 112.25(6) | 107.05(6) | 110.264(15) | 110.500(29) | 109.553(3) |
107.897(30) | 108.959(14) | 109.152(4) | ||||||
0.87 | 0.2357040(0) | 2.48430(14) | 2.58032(14) | 112.805(3) | 106.633(3) | 110.446(3) | 110.634(7) | 109.587(3) |
107.540(7) | 108.893(3) | 109.021(7) | ||||||
0.95 | 0.2285370(0) | 2.44849(4) | 2.59204(4) | 114.366(1) | 105.095(1) | 110.781(1) | 111.520(2) | 109.433(1) |
106.882(2) | 108.457(1) | 109.053(2) |
Table 4 Anion displacement, bond length and bond angle of CuIn(SexTe1-x)2 system
Se content (x) | Anion displacement (μm) | Bond length (Å) | Bond angle (°) | |||||
---|---|---|---|---|---|---|---|---|
d (Cu-Se/Te) | d (In-Se/Te) | Cu-Se/Te-Cu | In-Se/Te-In | Se/Te-Cu-Se/Te | Se/Te-In-Se/Te | Cu-Se/Te-In | ||
0.10 | 0.22393(30) | 2.5788(10) | 2.7638(11) | 115.36(7) | 104.09(6) | 106.511(33) | 108.155(16) | 109.104(7) |
110.971(17) | 112.136(32) | 109.289(16) | ||||||
0.18 | 0.2237(4) | 2.5638(14) | 2.7497(16) | 115.44(9) | 104.05(8) | 106.46(5) | 108.152(22) | 109.075(13) |
110.999(24) | 112.14(4) | 109.296(9) | ||||||
0.25 | 0.2238(4) | 2.5521(14) | 2.7365(16) | 115.39(9) | 104.05(8) | 106.51(5) | 108.139(22) | 109.117(14) |
110.973(24) | 112.17(4) | 109.277(10) | ||||||
0.33 | 0.21436(29) | 2.5130(9) | 2.7618(11) | 117.64(7) | 102.24(6) | 105.378(32) | 107.709(15) | 108.807(11) |
111.556(17) | 113.057(31) | 109.121(8) | ||||||
0.35 | 0.21188(25) | 2.4989(8) | 2.7642(10) | 118.24(6) | 101.76(5) | 105.088(29) | 107.593(13) | 108.723(14) |
111.706(15) | 113.298(27) | 109.065(8) | ||||||
0.40 | 0.2217(4) | 2.5143(17) | 2.7115(19) | 115.73(10) | 103.48(9) | 106.59(7) | 107.887(32) | 109.084(26) |
110.930(35) | 112.69(7) | 109.38(5) | ||||||
0.49 | 0.22873(29) | 2.5270(9) | 2.6739(11) | 114.28(7) | 105.10(6) | 106.979(32) | 108.431(15) | 109.130(8) |
110.731(16) | 111.573(31) | 109.398(16) | ||||||
0.55 | 0.23241(25) | 2.5312(9) | 2.6523(9) | 113.46(6) | 105.87(5) | 107.348(30) | 108.638(14) | 109.149(14) |
110.543(15) | 111.150(29) | 109.466(7) | ||||||
0.62 | 0.21928(25) | 2.4698(8) | 2.6797(9) | 116.44(6) | 103.17(5) | 106.000(28) | 107.919(13) | 109.196(6) |
111.234(14) | 112.623(27) | 109.006(9) | ||||||
0.68 | 0.2257(4) | 2.4863(14) | 2.6515(16) | 115.03(10) | 104.55(9) | 106.53(5) | 108.332(24) | 108.965(22) |
110.960(26) | 111.77(5) | 109.408(13) | ||||||
0.74 | 0.2337(4) | 2.5002(14) | 2.6105(15) | 113.19(10) | 106.17(9) | 107.44(5) | 108.734(23) | 109.114(7) |
110.495(24) | 110.96(5) | 109.508(6) | ||||||
0.77 | 0.21566(27) | 2.4449(8) | 2.6769(10) | 117.50(6) | 102.67(5) | 105.167(31) | 107.937(14) | 109.327(8) |
111.665(16) | 112.585(30) | 108.497(12) | ||||||
0.83 | 0.23797(27) | 2.4904(9) | 2.5713(9) | 112.25(6) | 107.05(6) | 110.264(15) | 110.500(29) | 109.553(3) |
107.897(30) | 108.959(14) | 109.152(4) | ||||||
0.87 | 0.2357040(0) | 2.48430(14) | 2.58032(14) | 112.805(3) | 106.633(3) | 110.446(3) | 110.634(7) | 109.587(3) |
107.540(7) | 108.893(3) | 109.021(7) | ||||||
0.95 | 0.2285370(0) | 2.44849(4) | 2.59204(4) | 114.366(1) | 105.095(1) | 110.781(1) | 111.520(2) | 109.433(1) |
106.882(2) | 108.457(1) | 109.053(2) |
Fig. 5 Schematic of phase formation in CuIn(SexTe1-x)2. Dark vertical lines are just markers. Grey vertical lines represent percentage (lengthwise) of the phases
Fig. 8 Raman spectra of a CuIn(Se0.1Te0.9)2 and b CuIn(Se0.5Te0.5)2, the symbols, lines and dark line show the experimental data, individual Lorentzians and the overall fit, respectively
Fig. 10 Results of A 1 mode analysis for CuIn(SexTe1-x)2, the average force constants for the calculations are taken from the results of the Rietveld refinement
Selenium content (x) | Raman shift (cm-1) | FWHM (cm-1) | |
---|---|---|---|
Observed | Calculated | ||
0.10 | 130.6 | 129.8 | 3.8 |
0.18 | 132.8 | 133.0 | 4.8 |
0.25 | 136.6 | 136.0 | 13.5 |
0.33 | 139.3 | 138.9 | 6.7 |
0.35 | 143.7 | 140.0 | 7.2 |
0.40 | 147.0 | 143.2 | 6.8 |
0.49 | 147.1 | 147.4 | 11.1 |
0.55 | 149.3 | 150.4 | 6.2 |
0.62 | 154.0 | 154.4 | 7.8 |
0.68 | 152.9 | 157.4 | 8.6 |
0.74 | 161.6 | 161.4 | 12.3 |
0.77 | 159.4 | 161.9 | 7.2 |
0.83 | 165.4 | 168.1 | 7.1 |
0.87 | 165.1 | 169.8 | 9.8 |
0.95 | 174.2 | 174.9 | 9.8 |
Table 5 Observed and calculated Raman shift for the A 1 mode for different phases, denoted by Se content (x)
Selenium content (x) | Raman shift (cm-1) | FWHM (cm-1) | |
---|---|---|---|
Observed | Calculated | ||
0.10 | 130.6 | 129.8 | 3.8 |
0.18 | 132.8 | 133.0 | 4.8 |
0.25 | 136.6 | 136.0 | 13.5 |
0.33 | 139.3 | 138.9 | 6.7 |
0.35 | 143.7 | 140.0 | 7.2 |
0.40 | 147.0 | 143.2 | 6.8 |
0.49 | 147.1 | 147.4 | 11.1 |
0.55 | 149.3 | 150.4 | 6.2 |
0.62 | 154.0 | 154.4 | 7.8 |
0.68 | 152.9 | 157.4 | 8.6 |
0.74 | 161.6 | 161.4 | 12.3 |
0.77 | 159.4 | 161.9 | 7.2 |
0.83 | 165.4 | 168.1 | 7.1 |
0.87 | 165.1 | 169.8 | 9.8 |
0.95 | 174.2 | 174.9 | 9.8 |
1. | S. Siebentritt, U. Rau (eds.), Wide-Gap Chalcopyrites (Springer, Berlin, 2006) |
2. | P.Y. Yu, D.H.C.M. Cardona, Fundamentals of Semiconductors: Physics and Materials Properties (Springer, Berlin, 2010) |
3. | D. Xue, K. Betzler, H. Hesse,Phys. Rev. B 62, 13546(2000) |
4. | D.N. Nikogosian, Nonlinear Optical Crystals: A Complete Survey (Springer, New York, 2005) |
5. | P. Jackson, D. Hariskos, E. Lotter, S. Paetel, R. Wuerz, R. Menner, W. Wischmann, M. Powalla,Prog. Photovolt. 19, 894(2011) |
6. | S. Marsillac, P.D. Paulson, M.W. Haimbodi, R.W. Birkmire, W.N. Shafarman,Appl. Phys. Lett. 81, 1350(2002) |
7. | K. Yamada, N. Hoshino, T. Nakada,Sci. Technol. Adv. Mater. 7, 42(2006) |
8. | V. Izquierdo-Roca, X. Fontane, J. Alvarez-Garcia, L. Calvo-Barrio, A. Perez-Rodriguez, J.R. Morante, C.M. Ruiz, E. Saucedo, V. Bermudez,Appl. Phys. Lett. 94, 061915(2009) |
9. | I.H. Choi, S.H. Eom, P.Y. Yu,J. Appl. Phys. 87, 3815(2000) |
10. | R. Diaz, M. Leon, F. Rueda,J. Vac. Sci. Technol. A 10, 295(1992) |
11. | R. Herberholz, M.J. Carter,Sol. Energy Mater. Sol. Cells 44, 357(1996) |
12. | I.V. Bodnar, N.P. Solovei, V.S. Gurin, A.P. Molochko,Semiconductors 38, 1402(2004) |
13. | B.R. Pamplin, T. Kiyosawa, K. Masumoto,Prog. Cryst. Growth Charact. Mater. 1, 331(1979) |
14. | J.E. Avon, K. Yoodee, J.C. Woolley,J. Appl. Phys. 55, 524(1984) |
15. | S. Chatraphorn, T. Panmatarite, S. Pramatus, A. Prichavudhi, R. Kritayakirana, J. Berananda, V. Sa-yakanit, J.C. Woolley,J. Appl. Phys. 57, 1791(1985) |
16. | C.H. Champnes,J. Mater. Sci. Mater. Electron. 1, 605(1999) |
17. | A.C. Larson, R.B. Von Dreele, General Structure Analysis System (GSAS), (Report LAUR 86-748),Los Alamos National Laboratory, 2004 |
18. | G. Masse, K. Djessas, L. Yarzhou,J. Appl. Phys. 74, 1376(1993) |
19. | R.A. Young (ed.), The Rietveld Method (IUCr Monograph on Crystallography, No. 5) (Oxford University Press, New York, 1993) |
20. | M. Leon, J.M. Merino, G. Van Tendeloo,Acta Microsc. 18, 128(2009) |
21. | N.F.M.Henry, K. Lonsdale (eds.), International Tables for X-Ray Crystallography, Vol. I. Symmetry Groups (The Kynoch Press, Birmingham, 1965) |
22. | S.R. Hall, J.M. Stewart,Acta Crystallogr. Sect. B Struct. Sci. 29, 579(1973) |
23. | T.R. Anantharaman, C. Suryanarayana,J. Mater. Sci. 6, 1111(1971) |
24. | W.D. Callister Jr, Fundamental of Materials Science and Engineering (Wiley, New York, 2001) |
25. | G.H. Chapman, J. Shewchun, J.J. Loferski, B.K. Garside, R. Beaulieu,Appl. Phys. Lett. 34, 735(1979) |
26. | J.E. Avon, J.C. Woolley,J. Appl. Phys. 52, 6423(1981) |
27. | B. Pamplin, R.S. Feigelson,Thin Solid Films 60, 141(1979) |
28. | M. Quintero, J.C. Woolley,J. Appl. Phys. 55, 2825(1984) |
29. | P. Grima, M. Quintero, C. Rincon, G.S. Peres, J.C. Woolley,Solid State Commun. 67, 81(1988) |
30. | M. Quintero, R. Tovar, E. Guerrero, F. Sanchez, J.C. Woolley,Phys. Status Solidi A 125, 161(1991) |
31. | L.P. Marushko, Y.E. Romanyuk, L.V. Piskach, O.V. Parasyuk, I.D. Olekseyuk, S.V. Volkov, V.I. Pekhnyo,Chem. Met. Alloys 3, 18(2010) |
32. | I.V. Bodnar, I.A. Zabelina, B.V. Korzun, A.P.Chernyakova, Zh Neorg, Khim. 36, 1062(1991) |
33. | L.S. Palatnik, E.I. Rogacheva,Sov. Phys. Dokl. 12, 503(1967) |
34. | I.P. Kaminow, E. Buehler, J.H. Wernick,Phys. Rev. B 2, 960(1970) |
35. | G.D. Holah, A.A. Schenk, S. Perkowitz, R.D. Tomlinson,Phys. Rev. B 23, 6288(1981) |
36. | H. Neumann,Helv. Phys. Acta 58, 337(1985) |
37. | P.N. Keating,Phys. Rev. 149, 674(1966) |
38. | V. Kumar, D. Chandra,Phys. Status Solidi B 212, 37(1999) |
39. | D. Papadimitriou, N. Esser, C. Xue,Phys. Status Solidi B 242, 2633(2005) |
40. | L. Genzel, W. Bauhofer,Z. Phys. B 25, 13(1976) |
41. | E. Oh, A.K. Ramdas,J. Electron. Mater. 23, 307(1994) |
42. | I.F. Chang, S.S.Mitra, Adv. Phys. 20, 359(1971) |
43. | H. Matsushita, S. Endo, T. Irie,Jpn. J. Appl. Phys. 31, 18(1992) |
44. | I.V. Bodnar,Semiconductors 32, 613(1998) |
45. | K. Takarabe, K. Kawai, K. Wakamura, S. Minomura, N. Yamamoto,J. Cryst. Growth 99, 766(1990) |
46. | I.V. Bodnar,J. Appl. Spectrosc. 66, 928(1999) |
47. | H. Tanino, H. Deai, H. Nakanishi,Jpn. J. Appl. Phys. 32, 436(1993) |
48. | Y. Cui, U.N. Roy, P. Bhattacharya, A. Parker, A. Burger, J.T. Goldstein,Solid State Commun. 150, 1686(2010) |
49. | I.V. Bodnar, G.F. Smirnova, A.G. Karoza, A.P. Chernyakova,Phys. Status Solidi B 158, 469(1990) |
50. | R. Bacewicz, W. Gebicki, J. Filipowicz,J. Phys. Condens. Matter 6, L777(1994) |
51. | S. Shirakata, T. Terasako, T. Kariya,J. Phys. Chem. Solids 66, 1970 (2005) |
52. | A. Anastassiadou, E. Liarokapis, E. Anastassakis,Solid State Comm. 69, 137(1989) |
53. | L.A. Farrow, J.M. Worlock, F. Turco-Sandroff, R.E. Nahory, R. Beserman, D.M. Hwang,Phys. Rev. B 45, 1231(1992) |
[1] | Ibrahim Ondicho, Bernard Alunda, Dicken Owino, Luke Otieno, Melody Chepkoech. Revealing a Transformation-Induced Plasticity (TRIP) Phenomenon in a Medium-Entropy Alloy [J]. Acta Metallurgica Sinica (English Letters), 2020, 33(8): 1159-1165. |
[2] | Chao Xiang, Zhi-Ming Zhang, Hua-Meng Fu, En-Hou Han, Jian-Qiu Wang, Hai-Feng Zhang, Guo-Dong Hu. Microstructure, Mechanical Properties, and Corrosion Behavior of MoNbFeCrV, MoNbFeCrTi, and MoNbFeVTi High-Entropy Alloys [J]. Acta Metallurgica Sinica (English Letters), 2019, 32(9): 1053-1064. |
[3] | De-Xin Ma, Fu Wang, Jian-Zheng Guo, Wen-Liang Xu. Single Crystal Castability and Undercoolability of PWA1483 Superalloy [J]. Acta Metallurgica Sinica (English Letters), 2019, 32(11): 1415-1420. |
[4] | Wei Wang, Zong-Ning Chen, En-Yu Guo, Hui-Jun Kang, Yi Liu, Cun-Lei Zou, Ren-Geng Li, Guo-Mao Yin, Tong-Min Wang. Influence of Cryorolling on the Precipitation of Cu-Ni-Si Alloys: An In Situ X-ray Diffraction Study [J]. Acta Metallurgica Sinica (English Letters), 2018, 31(10): 1089-1097. |
[5] | M. Santhiya, K.S. Pugazhvadivu, K. Tamilarasan, C. Rangasami. Influence of Sputtering Power on the Structure and Electrical Properties of Bi2Fe4O9 Thin Films [J]. Acta Metallurgica Sinica (English Letters), 2017, 30(7): 650-658. |
[6] | Yu Zhang, Fan-Song Wei, Jia-Ning Xiao, Xin Cai. Phase Structure and Electrochemical Properties of Melt-Spun La4MgNi17.5Mn1.5 Hydrogen Storage Alloys [J]. Acta Metallurgica Sinica (English Letters), 2017, 30(11): 1033-1039. |
[7] | Ning-Ning Li,Min-Zhi Wang,Yong-Sheng Li,Guang Chen,Pei Li. Corrosion Behavior of Fe-Al Coatings Fabricated by Pack Aluminizing Method [J]. Acta Metallurgica Sinica (English Letters), 2016, 29(9): 813-819. |
[8] | Min Liu,Hui-Qiang Liu,Sheng Chu,Ru-Fang Peng,Shi-Jin Chu. [0001]-Oriented InN Nanoleaves and Nanowires: Synthesis, Growth Mechanism and Optical Properties [J]. Acta Metallurgica Sinica (English Letters), 2016, 29(9): 820-826. |
[9] | A. Harizi, M. Ben Rabeh, M. Kanzari. Substrate Temperature-Dependent Physical Properties of Thermally Evaporated Sn4Sb6S13 Thin Films [J]. Acta Metallurgica Sinica (English Letters), 2016, 29(1): 79-88. |
[10] | Santhosh Manoharan, Rajeswarapalanichamy Ratnavelu, Sudhapriyanga Ganesapandian, Kanagaprabha Shanmugam, Iyakutti Kombiah. Investigation of Structural, Electronic and Mechanical Properties of Rubidium Metal Hydrides RbMH4 (M=B, Al, Ga) [J]. Acta Metallurgica Sinica (English Letters), 2015, 28(8): 975-983. |
[11] | Ratnavelu Rajeswarapalanichamy, Manoharan Santhosh, Ganesapandian Sudhapriyanga, Shanmugam Kanagaprabha, Kombaih Iyakutti. Structural Stability, Electronic Structure and Mechanical Properties of Li-N-H System [J]. Acta Metallurgica Sinica (English Letters), 2015, 28(5): 550-558. |
[12] | M. Jay Chithra, M. Sathya, K. Pushpanathan. Effect of pH on Crystal Size and Photoluminescence Property of ZnO Nanoparticles Prepared by Chemical Precipitation Method [J]. Acta Metallurgica Sinica (English Letters), 2015, 28(3): 394-404. |
[13] | Neena Bachan, A. Asha, W. Jothi Jeyarani, D. Arun Kumar, J. Merline Shyla. A Comparative Investigation on the Structural, Optical and Electrical Properties of SiO2-Fe3O4 Core-Shell Nanostructures with Their Single Components [J]. Acta Metallurgica Sinica (English Letters), 2015, 28(11): 1317-1325. |
[14] | C. J. Ajayakumar, A. G. Kunjomana. Gamma Irradiation Effects in InBi0.8Te0.2 Crystals Grown by Horizontal Directional Freezing [J]. Acta Metallurgica Sinica (English Letters), 2015, 28(10): 1205-1213. |
[15] | Anuradha Purohit, Subhash Chander, Satya Pal Nehra, Mahendra Singh Dhaka. Thickness Dependent Physical Properties of Thermally Evaporated Nanocrystalline CdSe Thin Films [J]. Acta Metallurgica Sinica (English Letters), 2015, 28(10): 1299-1304. |
Viewed | ||||||
Full text |
|
|||||
Abstract |
|
|||||