Acta Metallurgica Sinica (English Letters) ›› 1991, Vol. 4 ›› Issue (9): 225-229.

• Research paper • Previous Articles     Next Articles

A SOLUTION OF MINIMUM NORM FOR QUANTITATIVE PHASE ANALYSIS BY STANDARDLESS X-RAY DIFFRACTION

ZHAO Han GONG Yansheng SHEN Jingyuan RUAN Qikuan JIN Jialing ZHU Hanyu Research Institute of Qiqihar Steel Works,Fulaerji,China   

  • Received:1991-09-11 Revised:1991-09-11 Online:1991-09-11 Published:2009-10-10

Abstract: A new expression of quantitative phase analysis by standardless X-ray diffraction has been derived using intensity matrix of vector modulus.The criterion of standardless X-ray diffraction analysis was suggested,so as to separate the diffraction pattern of every phase from that of sample.The optimal solution could be obtained by the least squares regression.

Key words: X-ray diffraction, standardless phase analysis, least square regression