Fig. 1 a Inverse pole figure (IPF) and its distribution after annealed at 1000 °C for 1 h, b illustration of samples preparation

Fig. 2 a True stress-strain curves of samples during quasi-static compression at different strain rates, the superelasticity in a caused by not using an extensometer during the experiment. b True stress-strain curves of samples during dynamic impact deformation at different strain rates. c Logarithm of yielding strength as a function of the logarithm of strain rates (? are 0.029 and 0.190 for under quasi-static compression and dynamic impact, respectively)

Fig. 3 Microstructures of samples after quasi-static compression at a strain rate of 8.3 × 10-4 s-1: a SEM morphology, b TEM image and SAEDP

Fig. 4 SEM morphologies of the samples after dynamic impacting at different strain rates a, b 650 s-1; c, d 2300 s-1; e, f 3500 s-1; g, h 3800 s-1 (these grains with lath-like structure are surrounded by the yellow dashed lines, and the broad planes of laths are marked by the green lines)

Fig. 5 Statistics chart of average grain size

Fig. 6 EBSD analysis of the dynamic deformed sample at a strain rate of 3500 s-1; a IPF mapping; b enlargement of the triple twins formed area in a; c misorientation along the lines ‘‘1-2’’ of b, showing a large number of small-angle grain boundaries; d {111} pole figure of white framed area in b; e-g {111} pole figure of the corresponding areas in a

Fig. 7 a EBSD IPF mapping of dynamic deformed sample at a strain rate of 3800 s-1; b image quality (IQ) contrast of the same region (the inset is {111} pole figure of white rectangle); c misorientation along the yellow lines “1-2” in b, showing the large-angle grain boundary; d misorientation along the blue lines “3-4” in b, showing small-angle grain boundary

Fig. 8 TEM images of sample deformed at a strain rate of 3800 s-1. a Low magnification of TEM morphology contains the primary and secondary twins; b SAEDP corresponding to the position of circle in a; c TEM image and corresponding SAEDP of twins on other two {111} twinning planes unparalleled beam direction; d TEM image shows two primary twins with different contrasts; e TEM dark-field image of d; f SAEDP of d showing approximately 5.75° misorientation; g high-resolution TEM image of twins with different contrasts; h high-resolution TEM image of the interaction between SF and twin; i schematic observing directions in TEM

Fig. 9 a XRD patterns of samples deformed at different strain rates; b the (200) diffraction peak fitting by experiment curves for samples deformed at strain rates of 8.3 × 10-4 s-1 and 3800 s-1, respectively; c modified Williamson-Hall plots for samples deformed at different strain rates; d dislocation density determined from the modified Williamson-Hall plots