Acta Metallurgica Sinica (English Letters) ›› 2005, Vol. 18 ›› Issue (5): 642-646 .

• Research Articles • Previous Articles     Next Articles

SIMULATION OF THE MAGNETIZATION REVERSAL PROCESS OF RECTANGLE-SHAPED NiFe FILM ELEMENTS UNDER AN ORTHOGONAL MAGNETIC FIELD

W.L. Zhang, R.J. Tang, W.X. Zhang, B. Peng, H.C. Jiang and H.W. Zhang   

  1. School of Microelectronics and Solid-state Electronics University of Electronic Science and Technology of China, Chengdu 610054, China
  • Received:1900-01-01 Revised:1900-01-01 Online:2005-10-25 Published:2009-10-10
  • Contact: W.L. Zhang

Abstract: The magnetization reversal process of nano-size rectangle-shaped NiFe film elements with different aspect ratios have been investigated under the orthogonally applied magnetic fields by micromagnetic simulation. Different magnetization reversal modes can appear depending on whether the bias field is applied or not. When there is no bias field, double "C" state is the initial reversal state. However, when there is a bias field, "S" state is the starting mode. The larger the aspect ratio is, the larger the switching field is. But, when the aspect ratio is larger than 3, the increase of the switching field ceases. These results can provide useful information to the application of the patterned NiFe film with rectangular elements.

Key words: NiFe film element, micromagnetics, aspect ratio