Acta Metallurgica Sinica (English Letters) ›› 2002, Vol. 15 ›› Issue (1): 81-86 .

• Research Articles • Previous Articles     Next Articles

MULTIPLE-SCATTERING DETERMINATION TO THE LOCAL ADSORPTION GEOMETRY OF SO2/Pd(111)

S.Cao, J.C.Tang, P.Zhu   

  1. Department of Physics and State Key laboratory for Silicon Material, Zhejiang University, Hangzhou 310027, China
  • Received:2001-07-31 Revised:2001-10-28 Online:2002-02-15 Published:2009-10-10
  • Contact: S.Cao

Abstract: We have calculated the sulphur 1s near edge X-roy absorption fine structure (NEX-AFS) spectra of SO2 adsorbed on Pd( 111 ) in terms of the multiple-scattering Cluster(MSC) method. The origin of the resonances in the NEXAFS spectra has been re-xealed. By the MSC calculation and a (DV)-Xα study we have for the first time iden-tiffed two weak features existing in S K-edge NEXAFS of SO2/Pd(111) system, whichare attributed to the interaction between the adsorbate and the substrate. Moreover,MSC calculation together with the reliability factor (R-.factor) analysis are employedto determine the local adsorption structures. These results are broadly in agreementwith those of Fourier-transform analysis of the surface extended X-ray absorption finestructure (SEXAFS).

Key words: multiple-scattering cltster. near edge X-ray absorption fine structure, SO2 /Pd(111). D V-Xα method