Acta Metallurgica Sinica (English Letters) ›› 1993, Vol. 6 ›› Issue (1): 59-66.

• Research paper • Previous Articles     Next Articles

METHOD FOR POLYFAMILY PLANE TRACE ANALYSIS AND ITS APPLICATION

LI Yuqing Research Institute of Daye Steel Works,Huangshi,China Senior Engineer,Research Institute of Daye Steel Works,Huangshi 435001,China   

  • Received:1993-02-25 Revised:1993-02-25 Online:1993-02-25 Published:2009-10-10

Abstract: The formula for calculating included angle between polufamily plane traces of lattice systems in thin foit under hath zero tilt and non-zero tilt states was deduced and verified by certain prat tical examples.The method may be available to index the plane traces of slip.twin and other defects.especially to determine such planar defects as twin and other defects esperially

Key words: polyfamily plane, included trace angle, foil, tilt