Acta Metallurgica Sinica (English Letters) ›› 1994, Vol. 7 ›› Issue (3): 175-178.

• Research paper • Previous Articles     Next Articles

CONTAMINATION LINE METHOD AND COMPARISON OF FOIL THICKNESS MEASUREMENT METHODS IN TRANSMISSION ELECTRON MICROSCOPY

PAN ZhenpengGuangdong Mechanical College. Guangzhou. China   

  • Received:1994-06-25 Revised:1994-06-25 Online:1994-06-25 Published:2009-10-10

Abstract: The paper briefly introduces the Contamination Line Method for foil thickness measurement in transmission electron microscopy and compares it with four conventional methods: the convergent beam diffraction method, the contamination spot method, the methods hased on characteristic X-ray emission and continuous X-ray emission on the application, aperation and accuracy etc.

Key words: transmission electron microscopy, foil thickness measurement