Acta Metallurgica Sinica (English Letters) ›› 1996, Vol. 9 ›› Issue (4): 279-282.

• Research paper • Previous Articles     Next Articles

CHARACTERIZATION OF NANOSTRUCTURED MATERIALS BY ANALYTICAL ELECTRON MICROSCOPY

L.D. He,G.Y Zeng,X.Liu H.S. Hu,D.Song and L.Z.Cheng(Electron Microscope Laboratory Northeastern University Shenyang 110006, ChinaManuscript received 20 July 1995, in revised form 10 April 1996)   

  • Received:1996-08-25 Revised:1996-08-25 Online:1996-08-25 Published:2009-10-10

Abstract: The analytical electron microscopy has been used to characterize the morphology,structure and composition of the nanostructured material of Sn- Bi alloy prepared by a modified electrohydrodynamic technique. The electron diffraction pattern and the corresponding contrast image for the discrete particles with a diameter smaller than 4 nm have been obtained.It is shown that the nanocrystalline Sn-Bi alloy particles comprise a single crystal of Bi-containing β-Sn solid solution or of Sn-containing Bi solid solution. A direct preparation procedure of the samples during the electrohydrodynamic rapid solidification process has been developed for electron microscopic observation.

Key words: nanostructured material, electrohydrodynamic technique, analytical electron microscopy, Sn-Bi alloy