Acta Metallurgica Sinica (English Letters) ›› 1999, Vol. 12 ›› Issue (5): 962-967.

• Research paper • Previous Articles     Next Articles

XTEM STUDY ON ION PLATED STAINLESS STEEL MULTI LAYER FILMS

Z.M. Gu Shanghai Maritime University, Shanghai 200135, China   

  • Received:1999-10-25 Revised:1999-10-25 Online:1999-10-25 Published:2009-10-10

Abstract: In this paper, the cross sectional microstructure and crystal structure of ion plated multi layer films of stainless steel (1Cr18Ni9Ti ) were studied by cross sectional transmission electron microscopy (XTEM). The results show that ion plated stainless steel multi layer films are fine grained double phase steel films of austenites and ferrites.Cross section film growing microstructures can be divided into three zones: fine equiaxed crystals, fine columnar crystals and coarse columnar crystals. Interfaces in multi layer films can promote fine grained growing and interrupt columnar grained growing,and improve properties of film materials.

Key words: stainless steel, XTEM, multi layer films, ion plating