Acta Metallurgica Sinica (English Letters) ›› 2010, Vol. 23 ›› Issue (6): 461-472.DOI: 10.11890/1006-7191-106-461

• 研究论文 • 上一篇    下一篇

镍基G3钢在碳酸氢钠/碳酸钠缓冲介质中所成钝化膜的化学组成和Mott-Schottky研究

李党国   

  1. state key laboratory of tribology
  • 收稿日期:2010-03-30 修回日期:2010-06-18 出版日期:2010-12-25 发布日期:2010-12-14
  • 通讯作者: 李党国

Chemical composition and Mott-Schottky analysis of passive film formed on G3 alloy in bicarbonate/carbonate buffer solution

Dangguo LI, Darong CHEN, Jiadao WANG and Haosheng CHEN   

  1. State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China
  • Received:2010-03-30 Revised:2010-06-18 Online:2010-12-25 Published:2010-12-14
  • Contact: Darong CHEN

关键词: 镍基合金, 俄歇分析, X-射线光电子能谱, 电化学阻抗谱, Mott-Schottky曲线

Abstract: The chemical composition and semi-conductive properties of passive film on nickel-based alloy (G3 alloy) in bicarbonate/carbonate buffer solution were investigated by Auger spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), electrochemical impedance spectra (EIS) and Mott-Schottky plot. AES and XPS results showed that the passive film appeared double-layer, in which the inner film was composed of nickel oxide, the mixed nickel-chromium-molybdenum-manganese oxides were the major component of the outer film. The electrochemical results revealed that the factors including frequency, potential, time, temperature and pH value can affect the semi-conductive property, the doping densities decreased with increasing potential and pH value, prolonging time, and decreasing temperature. According to the above results, it can be concluded that the film protection on the substrate enhanced with increasing potential and pH value, prolonging time, and decreasing temperature.

Key words: Nickel-based alloy, Auger electron analysis (AES), X-ray photoelectron spectroscopy (XPS), Electrochemical impedance spectra (EIS), Mott-Schottky plot