Direct TEM Observation of Phase Separation and Crystallization in Cu45Zr45Ag10 Metallic Glass

Hui Wang, Shang-Gang Xiao, Tao Zhang, Qiang Xu, Zeng-Qian Liu, Meng-Yue Wu, Frans Tichelaar, Henny Zandbergen

Fig. 2 a Preparation scheme of TEM sample cut by focused ion beam from the electrochemically polished sample, b the sample transferred onto the in situ heating chip by an ex situ nanomanipulator