An Algorithm to Analyze Electron Backscatter Diffraction Data for Grain Reconstruction: from Methodology to Application

Xue-Hao Zheng, Hong-Wang Zhang

Fig. 9 Misorientation axis map a and misorientation angle map b for grains with areas larger than 20 μm2. Each color in a represents a specific misorientation axis between a pixel and the average orientation of the selected grain where the pixel is located. The color scheme used in a can be found in Fig. 6b. The black lines in a and b represent boundaries with misorientation angles larger than 5°