Acta Metallurgica Sinica (English Letters) ›› 2009, Vol. 22 ›› Issue (6): 435-439.DOI: 10.1016/S1006-7191(08)60120-9

• 研究论文 • 上一篇    下一篇

Measurement of remnant magnetic-field in Lorentz mode using Permalloy

段晓峰   

  1. 中国科学院物理研究所电子显微镜重点实验室
  • 收稿日期:2009-01-21 修回日期:2009-05-01 出版日期:2009-12-25 发布日期:2009-12-16
  • 通讯作者: 段晓峰

Measurement of the remnant magnetic-field in Lorentz mode using permalloy

Haihua LIU1, Xiaokun DUAN2, Renchao CHE1, Zhifeng WANG1,Xiaofeng DUAN1   

  1. 1) Beijing Laboratory of Electron Microscopy, Beijing National Laboratory for Condensed Matter Physics, nstitute of Physics, Chinese Academy of Sciences, Beijing 100190, China
    2) Advanced Technology & Materials Co., Ltd., Beijing 100081, China
  • Received:2009-01-21 Revised:2009-05-01 Online:2009-12-25 Published:2009-12-16
  • Contact: Xiaofeng DUAN

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摘要：

We report a novel method to measure the remnant magnetic field in Lorentz mode in a FEI Tecnai F20 TEM equipped with a Lorentz lens. The movement of the circle Bloch line of the cross-ties wall in Permalloy is used to measure the remnant magnetic field by tilting the specimen and increasing the objective lens current. The remnant magnetic field is estimated to be about 17 Oe, against the objective lens magnetic field, and can be compensated by increasing the objective lens current properly.

关键词: Lorentz electron microscopy, Lorentz lens, remnant magnetic field, Permalloy, cross-tie walls

Abstract:

A novel method was reported to measure the remnant magnetic field in Lorentz mode in a FEI Tecnai F20 transmission electron microscope equipped with a Lorentz lens. The movement of the circle Bloch line of the cross-tie wall in Permalloy is used to measure the remnant magnetic field by tilting the specimen and adjusting the objective lens current. The remnant magnetic field is estimated to be about 17 Oe, in a direction opposite to that of the objective lens magnetic field. The remnant magnetic field can be compensated by adjusting the value of the objective lens current.

Key words: Lorentz electron microscopy, Lorentz lens, Remnant magnetic field, Permalloy, Cross-tie walls